ECE270 Announcements

Please bring to the lectures a copy of the lecture notes posted on the course website (engineering.purdue.edu/ece270/). The lecture notes are identified by modules. The course schedule shows which module is covered in every lecture.
Homework 1 will be handed out in class on Fri 1/14 and it is due on Wed 1/20.
There will not be any quizzes. Clickers are not needed.

Irith Pomeranz

Professor of Electrical and Computer Engineering

Address

Purdue University
School of Electrical and Computer Engineering
1285 Electrical Engineering Building
West Lafayette, Indiana 47907-1285
Phone: +1 765 494-3357
Fax: +1 765 494-3371
Email: pomeranz@ecn.purdue.edu

Academic Degrees

1985 - B. Sc. in Computer Engineering (Summa Cum Laude), Department of Electrical Engineering, Technion, Israel.
1989 - D. Sc., Department of Electrical Engineering, Technion, Israel.

Academic Appointments

1989-1990 Lecturer, Department of Computer Science, Technion, Israel.
1990-1994 Assistant Professor, Department of Electrical and Computer Engineering, University of Iowa.
1994-1998 Associate Professor, Department of Electrical and Computer Engineering, University of Iowa.
July - December 1995 Visiting Associate Professor, Department of Electrical Engineering, Stanford University.
1998-2000 Professor, Department of Electrical and Computer Engineering, University of Iowa.
2000-present Professor, School of Electrical and Computer Engineering, Purdue University.

Awards

1992 - Best paper award, European Design Automation Conference (EURO-DAC '92).
1993 - Best paper award nomination, Design Automation Conference (DAC '93).
1993 - National Science Foundation Young Investigator Award (NYI).
1993 - Best paper award nomination, European Design Automation Conference (EURO-DAC '93).
1993 - Best paper award, European Design Automation Conference (EURO-DAC '93).
1997 - University of Iowa Faculty Scholar Award.
1999 - IEEE Fellow.

Research Interests and Recent Publications

Test Generation, Design-for-testability, Built-in Self-test and Diagnosis of VLSI Circuits
Test Generation

I. Pomeranz, S. M. Reddy and R. Guo, "Static Test Compaction for Synchronous Sequential Circuits Based on Vector Restoration", IEEE Transactions on Computer-Aided Design, July 1999, pp. 1040-1049.
I. Pomeranz and S. M. Reddy, "Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits", in Proc. 8th Asian Test Symp., Nov. 1999, pp. 75-80.
I. Pomeranz and S. M. Reddy, "On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults", IEEE Transactions on Computer-Aided Design, March 2000, pp. 372-383.

Design-for-testability

I. Pomeranz and S. M. Reddy, "On Achieving Complete Coverage of Delay Faults in Full Scan Circuits using Locally Available Lines", in Proc. 1999 Intl. Test Conf., Oct. 1999, pp. 923-931.
I. Pomeranz and Y. Zorian, "On Testing of Non-Isolated Embedded Legacy Cores and their Surrounding Logic", in Proc. 17th VLSI Test Symp., April 1999, pp. 41-48.

Built-in Self-test

I. Pomeranz and S. M. Reddy, "Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences", in Proc. 36th Design Autom. Conf., June 1999, pp. 754-759.
Y. Huang, I. Pomeranz, S. M. Reddy and J. Rajski "Improving the Proportion of At-Speed Tests in Scan BIST", in Proc. Intl. Conf. on Computer-Aided Design, Nov. 2000.

Diagnosis

I. Pomeranz and S. M. Reddy, "A Diagnostic Test Generation Procedure Based on Test Elimination by Vector Omission for Synchronous Sequential Circuits", IEEE Transactions on Computer-Aided Design, May 2000, pp. 589-600.
I. Pomeranz and S. M. Reddy, "On Diagnosis of Pattern-Dependent Delay Faults", in Proc. 37th Design Automation Conf., June 2000, pp. 59-62.

Professional Service

Conference and Workshop Program Committees (2000-2001)

IEEE VLSI Test Symposium, 2000.
IEEE International Conference on Dependable Systems and Networks (FTCS-30), 2000.
ACM/IEEE Design Automation Conference, 2000.
IEEE International Conference on Computer Design, 2000.
IEEE 4th Intl. Workshop on Testing Embedded Core based Systems, 2000.
IEEE 5th High-Level Design Validation and Test Workshop, 2000.
IEEE Asian Test Symposium, 2000.
IEEE VLSI Test Symposium, 2001.
ACM/IEEE Design Automation Conference, 2001.
IEEE Asian Test Symposium, 2001.

Conference Program Chair and Subcommittee Chair

Program co-chair, IEEE International Fault-Tolerant Computing Symposium, 1999.
Chair of the Subcommittee on Test, IEEE/ACM International Conference on Computer-Aided Design, 2000, 2001.
Program chair, IEEE VLSI Test Symposium, 2004.
Program chair, IEEE VLSI Test Symposium, 2005.
General chair, IEEE VLSI Test Symposium, 2006.

Editorial Boards

ACM Transactions on Design Automation, Associate Editor, 1995-2004.
IEEE Transactions on Computers, Associate Editor, 2002-2004.
IEEE Transactions on Computers, Co-guest editor of the Special Issue on Dependability of Computing Systems, January 1998.

M.S. Graduates at Purdue

Masao Naruse
Mesut Meterelliyoz
Anil Singhar

Ph.D. Graduates at Purdue

Enamul Amyeen
Yonsang Cho
Bharath Seshadri
Hangkyu Lee
Sungchul Park

Current Ph.D. Students

Askia Hill
Dongok Kim
Yixi Yang
Bo Yao