Please note that the expansion of the abbreviated solution names may be found from the following pages of the reference:

J-EDD, O-EDD: page 371
J-EDD+LA+LS: page 386, denoted as XO-EDD
DAST() and DASTwR(): page 366, denoted as DEC() and DECwR()

Reference: Ovacik, I. M, and Uzsoy, R., "Decomposition Methods for Scheduling Semiconductor Testing Facilities", International Journal of Flexible Manufacturing Systems 8, 357-398 (1996).